[1] |
Duan Bao-Xing, Liu Yu-Lin, Tang Chun-Ping, Yang Yin-Tang.Novel majority carrier accumulation insulated gate bipolar transistor with Schottky junction. Acta Physica Sinica, 2024, 73(7): 078501.doi:10.7498/aps.73.20231768 |
[2] |
Gou Shi-Long, Ma Wu-Ying, Yao Zhi-Bin, He Bao-Ping, Sheng Jiang-Kun, Xue Yuan-Yuan, Pan Chen.Radiation mechanism of gate-controlled lateral PNP bipolar transistors in the hydrogen environment. Acta Physica Sinica, 2021, 70(15): 156101.doi:10.7498/aps.70.20210351 |
[3] |
Lu Chao, Chen Wei, Luo Yin-Hong, Ding Li-Li, Wang Xun, Zhao Wen, Guo Xiao-Qiang, Li Sai.Effect of source-drain conduction in single-event transient on nanoscaled bulk fin field effect transistor. Acta Physica Sinica, 2020, 69(8): 086101.doi:10.7498/aps.69.20191896 |
[4] |
Zhang Jin-Feng, Yang Peng-Zhi, Ren Ze-Yang, Zhang Jin-Cheng, Xu Sheng-Rui, Zhang Chun-Fu, Xu Lei, Hao Yue.Characterization of high-transconductance long-channel hydrogen-terminated polycrystal diamond field effect transistor. Acta Physica Sinica, 2018, 67(6): 068101.doi:10.7498/aps.67.20171965 |
[5] |
Zhou Hang, Zheng Qi-Wen, Cui Jiang-Wei, Yu Xue-Feng, Guo Qi, Ren Di-Yuan, Yu De-Zhao, Su Dan-Dan.Enhanced channel hot carrier effect of 0.13 m silicon-on-insulator N metal-oxide-semiconductor field-effect transistor induced by total ionizing dose effect. Acta Physica Sinica, 2016, 65(9): 096104.doi:10.7498/aps.65.096104 |
[6] |
Tan Ji, Zhu Yang-Jun, Lu Shuo-Jin, Tian Xiao-Li, Teng Yuan, Yang Fei, Zhang Guang-Yin, Shen Qian-Xing.Modeling and simulation of the insulated gate bipolar transistor turn-off voltage slope under inductive load. Acta Physica Sinica, 2016, 65(15): 158501.doi:10.7498/aps.65.158501 |
[7] |
Liu Xiang-Yu, Hu Hui-Yong, Zhang He-Ming, Xuan Rong-Xi, Song Jian-Jun, Shu Bin, Wang Bin, Wang Meng.Study on the strained SiGe p-channel metal-oxide-semiconductor field-effect transistor with polycrystalline silicon germanium gate threshold voltage. Acta Physica Sinica, 2014, 63(23): 237302.doi:10.7498/aps.63.237302 |
[8] |
Ma Wu-Ying, Wang Zhi-Kuan, Lu Wu, Xi Shan-Bin, Guo Qi, He Cheng-Fa, Wang Xin, Liu Mo-Han, Jiang Ke.The base current broadening effect and charge separation method of gate-controlled lateral PNP bipolar transistors. Acta Physica Sinica, 2014, 63(11): 116101.doi:10.7498/aps.63.116101 |
[9] |
Hu Hui-Yong, Liu Xiang-Yu, Lian Yong-Chang, Zhang He-Ming, Song Jian-Jun, Xuan Rong-Xi, Shu Bin.Study on the influence of γ -ray total dose radiation effect on the threshold voltage and transconductance of the strained Si p-channel metal-oxide-semiconductor field-effect transistor. Acta Physica Sinica, 2014, 63(23): 236102.doi:10.7498/aps.63.236102 |
[10] |
Huo Wen-Juan, Xie Hong-Yun, Liang Song, Zhang Wan-Rong, Jiang Zhi-Yun, Chen Xiang, Lu Dong.Uni-traveling-carrier double heterojunction phototransistor photodetector. Acta Physica Sinica, 2013, 62(22): 228501.doi:10.7498/aps.62.228501 |
[11] |
You Hai-Long, Lan Jian-Chun, Fan Ju-Ping, Jia Xin-Zhang, Zha Wei.Research on characteristics degradation of n-metal-oxide-semiconductor field-effect transistor induced by hot carrier effect due to high power microwave. Acta Physica Sinica, 2012, 61(10): 108501.doi:10.7498/aps.61.108501 |
[12] |
Liu Ya-Qiang, An Zhen-Lian, Cang Jun, Zhang Ye-Wen, Zheng Fei-Hu.Influence of fluorination time on surface charge accumulation on epoxy resin insulation. Acta Physica Sinica, 2012, 61(15): 158201.doi:10.7498/aps.61.158201 |
[13] |
Xi Shan-Bin, Lu Wu, Ren Di-Yuan, Zhou Dong, Wen Lin, Sun Jing, Wu Xue.Quantitative separation of radiation induced charges for gate controlled later PNP bipolar transistors. Acta Physica Sinica, 2012, 61(23): 236103.doi:10.7498/aps.61.236103 |
[14] |
Xi Shan-Bin, Lu Wu, Wang Zhi-Kuan, Ren Di-Yuan, Zhou Dong, Wen Lin, Sun Jing.Use the subthreshold-current technique to separate radiation induced defects in gate controlled lateral pnp bipolar transistors. Acta Physica Sinica, 2012, 61(7): 076101.doi:10.7498/aps.61.076101 |
[15] |
Chen Jian-Jun, Chen Shu-Ming, Liang Bin, Liu Bi-Wei, Chi Ya-Qing, Qin Jun-Rui, He Yi-Bai.Influence of interface traps of p-type metal-oxide-semiconductor field effect transistor on single event charge sharing collection. Acta Physica Sinica, 2011, 60(8): 086107.doi:10.7498/aps.60.086107 |
[16] |
Wang Jin-Ping, Xu Jian-Ping, Xu Yang-Jun.Analysis of multi-switching period oscillation phenomenon in constant on-time controlled buck converter. Acta Physica Sinica, 2011, 60(5): 058401.doi:10.7498/aps.60.058401 |
[17] |
Liu Yu-Rong, Chen Wei, Liao Rong.Low-operating-voltage polymer thin-film transistors based on poly(3-hexylthiophene). Acta Physica Sinica, 2010, 59(11): 8088-8092.doi:10.7498/aps.59.8088 |
[18] |
Liu Hong-Xia, Yin Xiang-Kun, Liu Bing-Jie, Hao Yue.Threshold voltage analytic model for strained SiGe-on-insulator p-channel metal-oxide-semiconductor-field-effect-transistor. Acta Physica Sinica, 2010, 59(12): 8877-8882.doi:10.7498/aps.59.8877 |
[19] |
Tang Xiao-Yan, Zhang Yi-Men, Zhang Yu-Ming.. Acta Physica Sinica, 2002, 51(4): 771-775.doi:10.7498/aps.51.771 |
[20] |
REN HONG-XIA, HAO YUE, XU DONG-GANG.STUDY ON HOT-CARRIER-EFFECT FOR GROOVED-GATE N-CHANNEL METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT-TRANSISTOR. Acta Physica Sinica, 2000, 49(7): 1241-1248.doi:10.7498/aps.49.1241 |