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Abstract

Silicon drift detector (SDD) is a kind of high performance X-ray detector, which is widely used. The ray detection system based on SDD is composed of SDD device, preamplifier and pulse processing system. The now available pulse processing system has the problems of poor pulse pile-up rejection performance and being vulnerable to the parameter fluctuations of front-end system, which degrades the performance of detection system. A digital pulse processing system is proposed. In this system, analog-to-digital converter (ADC) directly samples the output signal of preamplifier, and transmits the data to the digital pulse processing platform for processing. According to the signal characteristics of SDD device and preamplifier, the influence of ADC sampling bits and sampling frequency on system performance is analyzed. Two optimized ADC sampling circuits are proposed to reduce energy resolution degradation induced by insufficient ADC sampling bits. The pulse shaping algorithm in the digital pulse processing system is studied. The results show that the shaping signal will not be distorted due to the parameter fluctuations of the front-end system, which proves the robustness of the digital pulse processing system. The digital pulse processing system is implemented and tested, and the correctness of the system is verified.

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Corresponding author:Wang Guan-Ying,wangguanying@ime.ac.cn

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Cited By

DownLoad: Full-Size Img PowerPoint

序号	反馈电容/fF	转换增益/(mV·keV^-1)
1	≈ 125	≈ 0.35
2	≈ 50	≈ 0.88
3	≈ 25	≈ 1.76

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参数	$\sigma_{{\rm{s}}}/A_{{\rm{mp}}}$	$ \sigma_{ {\rm{p} }}/\sigma_{ {\rm{s} }} $	备注
条件1	2.65%	2%	串联与并联白噪声强度相近
条件2	2.65%	0.5%	串联白噪声占主导作用
条件3	0.53%	2%	串联与并联白噪声强度较小

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影响因素	与成形时间的关联性
法诺效应	不相关
电荷收集效率	不相关
串联白噪声	随成形时间增大而减小
闪烁噪声	不相关
并联白噪声	随成形时间增大而增大

DownLoad: CSV

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Vol. 71, Issue 1 - 2022-01-05

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