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Abstract

Charging and discharging characteristics of dielectric in space electron radiation environment are closely related to the surface charge exchange process and internal charge transfer process. Surface or internal charge movement of dielectric depends largely on the microscopic characteristics of the material, and space charge and trap are important parameters reflecting the microscopic characteristics of dielectric. In this work, the formation, mechanism, measurement method, existing problems and research status of space charge and trap in insulation material in electronic radiation environment are reviewed. Firstly, the interaction mechanism between incident electron and dielectric material and the formation of deposition charge are briefly introduced. The advantages and disadvantages of radiation-induced conductance model and electron-hole pair generation/recombination model are analyzed. The classical electro-acoustic pulse method (PEA) and " short circuit PEA” and " open circuit PEA” which are suitable for space charge measurement under electron beam radiation are compared with each other and analyzed, and further, the main technical difficulties in designing PEA device under electron beam radiation are reviewed. Secondly, the methods of extracting trap parameters, including thermal stimulation current method, surface potential decay method, space charge decay method are compared with each other. It is pointed out that the method of injecting the electrons and the method of measuring the surface potential in the same vacuum environment are more suitable for measuring the trap parameters of space dielectric materials. Finally, the scientific problems that need solving in space insulation are prospected from the aspects of theoretical model, parameter characterization and measurement technology.

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Authors and contacts

Li Guo-Chang^1,2,
Li Sheng-Tao²

Corresponding author:Li Sheng-Tao,sli@mail.xjtu.edu.cn

Funds:Project supported by National Natural Science Foundation of China (Grant Nos. 51907095, 11575140), the China Postdoctoral Science Foundation (Grant No. 2019M653629), and the Qingdao Applied Foundation Basic Research Program, China (Grant No. 18-2-2-23-jch)

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方法	基本原理	优缺点
等温表面电位衰减法(ISPD)	采用电晕注入或电子辐射方式向介质表层注入电荷, 通过测量等温电位衰减曲线, 提取陷阱参数.	优点: 可以区分电子陷阱和空穴陷阱^[39,45]; 电子辐射注入方式更适合空间介质材料陷阱参数的测量^[28,34]. 缺点: 电荷注入深度较浅(约1—2 μm), 主要反映材料表面或表层陷阱信息; 不适用于较厚试样^[46].
热刺激电流法(TSC)	采用热刺激或光刺激使介质内部被捕获电荷脱陷, 通过分析电流特征峰, 提取陷阱参数.	优点: 反映材料内部陷阱信息; 可以区分陷阱能级^[39,47]. 缺点: 无法区分陷阱类型.
电声脉冲法(PEA)	通过分析去压后总电荷量随时间的衰减规律, 提取陷阱参数.	优点: 可以反映介质内部电荷动态过程^[9,10,47]. 缺点: 无法区分陷阱类型; 计算模型有待完善.

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Vol. 68, Issue 23 - 2019-12-05

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