\begin{document}$\gamma$\end{document} source is called detector and the other one is called absorption detector. The material of scatter detector is selected as low-Z silicon and carbon, and the absorb detector is high-Z germanium. The thickness value of scatter detector and absorb detector are both 20 mm. The spacing between the two layers is 100 mm. The simulation results by Geant 4 are used to reconstruct the image of point-like \begin{document}$\gamma$\end{document} source through using the back-projection algorithm. The simulation results and the re-constructed images indicate that the difference between the image full width at half maximum induced by 2 mm position resolution and that induced by 5.0% relative energy resolution of scatter detector is about 10%, and amount to that by the Doppler effect of Silicon. For the \begin{document}$\gamma$\end{document} ray with energies of several hundred keV, the energy resolution of Si detectors is easily better than 1.0% in practice. Therefore, the detector's position resolution dominates the image quality of the Compton camera. Considering the Doppler effect, manufacturing techniques and imaging efficiency, 2.0 mm-sized crystal unit and 1.0% energy resolution power is suggested for practically manufacturing the Compton camera."> - 必威体育下载

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    Song Zhang-Yong, Yu De-Yang, Cai Xiao-Hong
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    • Abstract views:9645
    • PDF Downloads:194
    • Cited By:0
    Publishing process
    • Received Date:21 December 2018
    • Accepted Date:15 March 2019
    • Available Online:01 June 2019
    • Published Online:05 June 2019

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