[1] |
Luo Jin-Bao, Vasiliy Pelenovich, Zeng Xiao-Mei, Hao Zhong-Hua, Zhang Xiang-Yu, Zuo Wen-Bin, Fu De-Jun.Effect of ion dose ratio on multilevel energy smoothing model of gas cluster. Acta Physica Sinica, 2021, 70(22): 223601.doi:10.7498/aps.70.20202011 |
[2] |
Zhang Ye, Zhang Ran, Chang Qing, Li Hua.Surface effects on Couette gas flows in nanochannels. Acta Physica Sinica, 2019, 68(12): 124702.doi:10.7498/aps.68.20190248 |
[3] |
Zhang Ran, Xie Wen-Jia, Chang Qing, Li Hua.Molecular dynamics simulations of surface effects on Couette gas flows in nanochannels. Acta Physica Sinica, 2018, 67(8): 084701.doi:10.7498/aps.67.20172706 |
[4] |
Wang Jian-Guo, Yang Song-Lin, Ye Yong-Hong.Effect of silver film roughness on imaging property of BaTiO3 microsphere. Acta Physica Sinica, 2018, 67(21): 214209.doi:10.7498/aps.67.20180823 |
[5] |
Cheng Guang-Gui, Zhang Zhong-Qiang, Ding Jian-Ning, Yuan Ning-Yi, Xu Duo.Wetting behaviors of the molten silicon on graphite surface. Acta Physica Sinica, 2017, 66(3): 036801.doi:10.7498/aps.66.036801 |
[6] |
Song Yan-Song, Yang Jian-Feng, Li Fu, Ma Xiao-Long, Wang Hong.Method of controlling optical surface roughness based on stray light requirements. Acta Physica Sinica, 2017, 66(19): 194201.doi:10.7498/aps.66.194201 |
[7] |
Song Yong-Feng, Li Xiong-Bing, Shi Yi-Wei, Ni Pei-Jun.Effects of surface roughness on diffuse ultrasonic backscatter in the solids. Acta Physica Sinica, 2016, 65(21): 214301.doi:10.7498/aps.65.214301 |
[8] |
Wang Yu-Xiang, Chen Shuo.Drops on microstructured surfaces: A numerical study using many-body dissipative particle dynamics. Acta Physica Sinica, 2015, 64(5): 054701.doi:10.7498/aps.64.054701 |
[9] |
Chen Su-Ting, Hu Hai-Feng, Zhang Chuang.Surface roughness modeling based on laser speckle imaging. Acta Physica Sinica, 2015, 64(23): 234203.doi:10.7498/aps.64.234203 |
[10] |
Li Zi-Zheng, Yang Hai-Gui, Wang Xiao-Yi, Gao Jin-Song.Investigations of high-quality aluminum film with large-area uniformity for large-size echelle grating. Acta Physica Sinica, 2014, 63(15): 157801.doi:10.7498/aps.63.157801 |
[11] |
Ma Jing-Jie, Xia Hui, Tang Gang.Dynamic scaling behavior of the space-fractional stochastic growth equation with correlated noise. Acta Physica Sinica, 2013, 62(2): 020501.doi:10.7498/aps.62.020501 |
[12] |
Cao Hong, Huang Yong, Chen Su-Fen, Zhang Zhan-Wen, Wei Jian-Jun.Influence of pulse tapping technology on surface roughness of polyimide capsule. Acta Physica Sinica, 2013, 62(19): 196801.doi:10.7498/aps.62.196801 |
[13] |
Ke Chuan, Zhao Cheng-Li, Gou Fu-Jun, Zhao Yong.Molecular dynamics study of interaction between the H atoms and Si surface. Acta Physica Sinica, 2013, 62(16): 165203.doi:10.7498/aps.62.165203 |
[14] |
Huang Xiao-Yu, Cheng Xin-Lu, Xu Jia-Jing, Wu Wei-Dong.Atomistic study of deposition process of Be thin film on Be substrate. Acta Physica Sinica, 2012, 61(9): 096801.doi:10.7498/aps.61.096801 |
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Ma Hai-Min, Hong Liang, Yin Yi, Xu Jian, Ye Hui.Preparation and property of super-hydrophilic SiO2-TiO2 nano-particle layer. Acta Physica Sinica, 2011, 60(9): 098105.doi:10.7498/aps.60.098105 |
[16] |
Ding Yan-Li, Zhu Zhi-Li, Gu Jin-Hua, Shi Xin-Wei, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao.Effect of deposition rate on the scaling behavior of microcrystalline silicon films prepared by very high frequency-plasma enhanced chemical vapor deposition. Acta Physica Sinica, 2010, 59(2): 1190-1195.doi:10.7498/aps.59.1190 |
[17] |
Gu Jin-Hua, Ding Yan-Li, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao.A spectroscopic ellipsometry study of the abnormal scaling behavior of high-rate-deposited microcrystalline silicon films by VHF-PECVD technique. Acta Physica Sinica, 2009, 58(6): 4123-4127.doi:10.7498/aps.58.4123 |
[18] |
Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing.Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity. Acta Physica Sinica, 2007, 56(4): 2422-2427.doi:10.7498/aps.56.2422 |
[19] |
Hou Hai-Hong, Sun Xi-Lian, Shen Yan-Ming, Shao Jian-Da, Fan Zheng-Xiu, Yi Kui.Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporation. Acta Physica Sinica, 2006, 55(6): 3124-3127.doi:10.7498/aps.55.3124 |
[20] |
LI MING-HUA, YU GUANG-HUA, JIANG HONG-WEI, CAI JIAN-WANG, ZHU FENG-WU.EFFECT OF Ta AND Ta/Cu BUFFERS ON THE EXCHANGE BIAS FIELD OFNiFe/FeMn BILAYERS. Acta Physica Sinica, 2001, 50(11): 2230-2234.doi:10.7498/aps.50.2230 |