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Chen Ji-Hui, Wang Feng, Li Yu-Long, Zhang Xing, Yao Ke, Guan Zan-Yang, Liu Xiang-Ming.Tomographic incoherent holography for microscale X-ray source. Acta Physica Sinica, 2023, 72(19): 195203.doi:10.7498/aps.72.20230920 |
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Yang Jun-Liang, Li Zhong-Liang, Li Tang, Zhu Ye, Song Li, Xue Lian, Zhang Xiao-Wei.Characteristics of multi-crystals monfiguration X-ray diffraction and application in characterizing synchrotron beamline bandwidth. Acta Physica Sinica, 2020, 69(10): 104101.doi:10.7498/aps.69.20200165 |
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Wang Yan, Liu Xin, Huang Wan-Xia, Yi Ming-Hao, Guo Jin-Chuan, Zhu Pei-Ping.. Acta Physica Sinica, 2017, 66(8): 089901.doi:10.7498/aps.66.089901 |
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Mou Huan, Li Bao-Quan, Cao Yang.Transmission-type miniature micro-beam modulated X-ray source based on space application. Acta Physica Sinica, 2016, 65(14): 140703.doi:10.7498/aps.65.140703 |
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Liu Xin, Yi Ming-Hao, Guo Jin-Chuan.Line focal X-ray source imaging. Acta Physica Sinica, 2016, 65(21): 219501.doi:10.7498/aps.65.219501 |
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Chen Xiao-Hu, Wang Xiao-Fang, Zhang Wei-Wei, Wang Wen-Hui.Analysis of imaging an extended X-ray source by using a Fresnel phase zone plate. Acta Physica Sinica, 2013, 62(1): 015208.doi:10.7498/aps.62.015208 |
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Huang Kai, Yan Wen-Chao, Li Ming-Hua, Tao Meng-Ze, Chen Yan-Ping, Chen Jie, Yuan Xiao-Hui, Zhao Jia-Rui, Ma Yong, Li Da-Zhang, Gao Jie, Chen Li-Ming, Zhang Jie.X-ray source produced by laser solid target interaction at kHz repetition rate. Acta Physica Sinica, 2013, 62(20): 205204.doi:10.7498/aps.62.205204 |
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Han Kui, Wang Juan-Juan, Zhou Fei, Shen Xiao-Peng, Shen Yi-Feng, Wu Yu-Xi, Tang Gang.Goos-Hänchen shift of self-collimated beam in Kretschmann configuration based on photonic crystal. Acta Physica Sinica, 2013, 62(4): 044221.doi:10.7498/aps.62.044221 |
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Deng Ning-Qin, Zhao Bao-Sheng, Sheng Li-Zhi, Yan Qiu, Yang Hao, Liu Duo.A space audio cummunication system based on X-ray. Acta Physica Sinica, 2013, 62(6): 060705.doi:10.7498/aps.62.060705 |
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
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