[1] |
Zhang Yang, Zhang Zhi-Hao, Wang Yu-Jian, Xue Xiao-Lan, Chen Ling-Xiu, Shi Li-Wei.Polarization modulation scanning optical microscopy method. Acta Physica Sinica, 2024, 73(15): 157801.doi:10.7498/aps.73.20240688 |
[2] |
Wei Qian-Yi, Ni Jie-Lei, Li Ling, Zhang Yu-Quan, Yuan Xiao-Cong, Min Chang-Jun.Research progress of ultra-high spatiotemporally resolved microscopy. Acta Physica Sinica, 2023, 72(17): 178701.doi:10.7498/aps.72.20230733 |
[3] |
Zhang Yi-Yi, Wu Jia-Chen, Hao Ran, Jin Shang-Zhong, Cao Liang-Cai.Digital holographic microscopy for red blood cell imaging. Acta Physica Sinica, 2020, 69(16): 164201.doi:10.7498/aps.69.20200357 |
[4] |
Wang Yue-Tong, Shang Luo-Ran, Zhao Yuan-Jin.Surface-textured polymer microspheres generated through interfacial instabilities of microfluidic droplets for cell capture. Acta Physica Sinica, 2020, 69(8): 084701.doi:10.7498/aps.69.20200362 |
[5] |
Cheng Guang-Gui, Zhang Zhong-Qiang, Ding Jian-Ning, Yuan Ning-Yi, Xu Duo.Wetting behaviors of the molten silicon on graphite surface. Acta Physica Sinica, 2017, 66(3): 036801.doi:10.7498/aps.66.036801 |
[6] |
Song Yan-Song, Yang Jian-Feng, Li Fu, Ma Xiao-Long, Wang Hong.Method of controlling optical surface roughness based on stray light requirements. Acta Physica Sinica, 2017, 66(19): 194201.doi:10.7498/aps.66.194201 |
[7] |
Liu Shuang-Long, Liu Wei, Chen Dan-Ni, Qu Jun-Le, Niu Han-Ben.Research on coherent anti-Stokes Raman scattering microscopy. Acta Physica Sinica, 2016, 65(6): 064204.doi:10.7498/aps.65.064204 |
[8] |
Song Yong-Feng, Li Xiong-Bing, Shi Yi-Wei, Ni Pei-Jun.Effects of surface roughness on diffuse ultrasonic backscatter in the solids. Acta Physica Sinica, 2016, 65(21): 214301.doi:10.7498/aps.65.214301 |
[9] |
Wang Yu-Xiang, Chen Shuo.Drops on microstructured surfaces: A numerical study using many-body dissipative particle dynamics. Acta Physica Sinica, 2015, 64(5): 054701.doi:10.7498/aps.64.054701 |
[10] |
Chen Su-Ting, Hu Hai-Feng, Zhang Chuang.Surface roughness modeling based on laser speckle imaging. Acta Physica Sinica, 2015, 64(23): 234203.doi:10.7498/aps.64.234203 |
[11] |
Liu Cheng, Pan Xing-Chen, Zhu Jian-Qiang.Coherent diffractive imaging based on the multiple beam illumination with cross grating. Acta Physica Sinica, 2013, 62(18): 184204.doi:10.7498/aps.62.184204 |
[12] |
Cao Hong, Huang Yong, Chen Su-Fen, Zhang Zhan-Wen, Wei Jian-Jun.Influence of pulse tapping technology on surface roughness of polyimide capsule. Acta Physica Sinica, 2013, 62(19): 196801.doi:10.7498/aps.62.196801 |
[13] |
Wang Shu-Ying, Zhang Hai-Jun, Zhang Dong-Xian.Location-free optical microscopic imaging method with high-resolution based on microsphere superlenses. Acta Physica Sinica, 2013, 62(3): 034207.doi:10.7498/aps.62.034207 |
[14] |
Zhou Guang-Zhao, Wang Yu-Dan, Ren Yu-Qi, Chen Can, Ye Lin-Lin, Xiao Ti-Qiao.Digital simulation for 3D reconstruction of coherent x-ray diffractive imaging. Acta Physica Sinica, 2012, 61(1): 018701.doi:10.7498/aps.61.018701 |
[15] |
Zhou Guang-Zhao, Tong Ya-Jun, Chen Can, Ren Yu-Qi, Wang Yu-Dan, Xiao Ti-Qiao.Digital simulation for coherent X-ray diffractive imaging. Acta Physica Sinica, 2011, 60(2): 028701.doi:10.7498/aps.60.028701 |
[16] |
Ding Yan-Li, Zhu Zhi-Li, Gu Jin-Hua, Shi Xin-Wei, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao.Effect of deposition rate on the scaling behavior of microcrystalline silicon films prepared by very high frequency-plasma enhanced chemical vapor deposition. Acta Physica Sinica, 2010, 59(2): 1190-1195.doi:10.7498/aps.59.1190 |
[17] |
Gu Jin-Hua, Ding Yan-Li, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao.A spectroscopic ellipsometry study of the abnormal scaling behavior of high-rate-deposited microcrystalline silicon films by VHF-PECVD technique. Acta Physica Sinica, 2009, 58(6): 4123-4127.doi:10.7498/aps.58.4123 |
[18] |
Zhang Bao-Ling, He Zhi-Bing, Wu Wei-Dong, Liu Xing-Hua, Yang Xiang-Dong.Influence of duty ratio on the fabrication of a-C:H film on microshell. Acta Physica Sinica, 2009, 58(9): 6436-6440.doi:10.7498/aps.58.6436 |
[19] |
Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing.Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity. Acta Physica Sinica, 2007, 56(4): 2422-2427.doi:10.7498/aps.56.2422 |
[20] |
Hou Hai-Hong, Sun Xi-Lian, Shen Yan-Ming, Shao Jian-Da, Fan Zheng-Xiu, Yi Kui.Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporation. Acta Physica Sinica, 2006, 55(6): 3124-3127.doi:10.7498/aps.55.3124 |