[1] |
Dai Zhong-Hua, Zhou Sui-Hua, Zhang Xiao-Bing.Multi-objective optimization of ship magnetic field modeling method. Acta Physica Sinica, 2021, 70(16): 164101.doi:10.7498/aps.70.20210334 |
[2] |
Xiao Ting-Hui, Yu Yang, Li Zhi-Yuan.Graphene-silicon hybrid photonic integrated circuits. Acta Physica Sinica, 2017, 66(21): 217802.doi:10.7498/aps.66.217802 |
[3] |
Li Jia-Wei, Lu Li-Cheng, Guo Sheng-Ming, Ma Li.Inversion of seabed attenuation by using single mode extracted by warping transform. Acta Physica Sinica, 2017, 66(20): 204301.doi:10.7498/aps.66.204301 |
[4] |
Yang Xiao-Kuo, Zhang Bin, Cui Huan-Qing, Li Wei-Wei, Wang Sen.Magnetization dynamics in ferromagnetic coupling interconnect wire using multiferroic logic scheme. Acta Physica Sinica, 2016, 65(23): 237502.doi:10.7498/aps.65.237502 |
[5] |
Guo Yu-Quan, Duan Shu-Kai, Wang Li-Dan.Influence of length parameter on the characteristics of nanoscale titanium oxide memristor. Acta Physica Sinica, 2015, 64(10): 108502.doi:10.7498/aps.64.108502 |
[6] |
Gao Hong-Yuan, Li Chen-Wan.Membrane-inspired quantum bee colony algorithm for multiobjective spectrum allocation. Acta Physica Sinica, 2014, 63(12): 128802.doi:10.7498/aps.63.128802 |
[7] |
Zhang Yan, Dong Gang, Yang Yin-Tang, Wang Ning, Wang Feng-Juan, Liu Xiao-Xian.A novel interconnect-optimal power model considering self-heating effect. Acta Physica Sinica, 2013, 62(1): 016601.doi:10.7498/aps.62.016601 |
[8] |
Qian Li-Bo, Zhu Zhang-Ming, Yang Yin-Tang.Through-silicon-via-aware interconnect prediction model for 3D integrated circuirt. Acta Physica Sinica, 2012, 61(6): 068001.doi:10.7498/aps.61.068001 |
[9] |
Wang Yu-Ling, Sun Yi-Ze, Peng Le-Le, Xu Yang.Parameter extraction for photovoltaic module based on Lambert W function. Acta Physica Sinica, 2012, 61(24): 248402.doi:10.7498/aps.61.248402 |
[10] |
Zhang Jin-Song, Wu Yi-Ping, Wang Yong-Guo, Tao Yuan.Thermomigration in micro interconnects in integrated circuits. Acta Physica Sinica, 2010, 59(6): 4395-4402.doi:10.7498/aps.59.4395 |
[11] |
Zhu Zhang-Ming, Hao Bao-Tian, Li Ru, Yang Yin-Tang.A novel nanometer CMOS interconnect optimal model with target delay and bandwidth constraint. Acta Physica Sinica, 2010, 59(3): 1997-2003.doi:10.7498/aps.59.1997 |
[12] |
Zhou Wen, Liu Hong-Xia.Quantitative analysis on median-time-to-fail of copper interconnect with lose object defects. Acta Physica Sinica, 2009, 58(11): 7716-7721.doi:10.7498/aps.58.7716 |
[13] |
Li Xin, Wang Janet M., Tang Wei-Qing.Stochastic collocation method for interconnect delay estimation in the presence of process variations. Acta Physica Sinica, 2009, 58(6): 3603-3610.doi:10.7498/aps.58.3603 |
[14] |
Zhu Zhang-Ming, Zhong Bo, Hao Bao-Tian, Yang Yin-Tang.A novel temperature-aware distributed interconnect power model. Acta Physica Sinica, 2009, 58(10): 7124-7129.doi:10.7498/aps.58.7124 |
[15] |
Zhu Zhang-Ming, Hao Bao-Tian, Qian Li-Bo, Zhong Bo, Yang Yin-Tang.A compact interconnect temperature distribution model considering the via effect and the heat fringing effect. Acta Physica Sinica, 2009, 58(10): 7130-7135.doi:10.7498/aps.58.7130 |
[16] |
Zhu Zhang-Ming, Qian Li-Bo, Yang Yin-Tang.A novel interconnect crosstalk RLC analytic model based on the nanometer CMOS technology. Acta Physica Sinica, 2009, 58(4): 2631-2636.doi:10.7498/aps.58.2631 |
[17] |
Wang Jun-Zhong, Ji Yuan, Wang Xiao-Dong, Liu Zhi-Min, Luo Jun-Feng, Li Zhi-Guo.Microstructures of Al and Cu interconnects. Acta Physica Sinica, 2007, 56(1): 371-375.doi:10.7498/aps.56.371 |
[18] |
Xiao Xia, You Xue-Yi, Yao Su-Ying.Dispersion feature in arbitrary direction of surface acoustic wave applied to property characterization of ultra-large-scale integrated circuit interconnect films. Acta Physica Sinica, 2007, 56(4): 2428-2433.doi:10.7498/aps.56.2428 |
[19] |
Zhang Wen-Jie, Yi Wan-Bing, Wu Jin.Electromigration in Al interconnects and the challenges in ultra-deep submicron technology. Acta Physica Sinica, 2006, 55(10): 5424-5434.doi:10.7498/aps.55.5424 |
[20] |
Zong Zhao-Xiang, Du Lei, Zhuang Yi-Qi, He Liang, Wu Yong.Modeling of resistance changes based on the free volume in VLSI interconnection electromigration. Acta Physica Sinica, 2005, 54(12): 5872-5878.doi:10.7498/aps.54.5872 |