[1] |
Su Le, Wang Cai-Lin, Tan Zai-Chao, Luo Yin, Yang Wu-Hua, Zhang Chao.Establishment of analytical model for electrostatic discharge gate-to-source capacitance of power metal-oxide-semiconductor field-effect transistor. Acta Physica Sinica, 2024, 73(11): 118501.doi:10.7498/aps.73.20240144 |
[2] |
Li Ming-Zhu, Cai Xiao-Wu, Zeng Chuan-Bin, Li Xiao-Jing, Li Duo-Li, Ni Tao, Wang Juan-Juan, Han Zheng-Sheng, Zhao Fa-Zhan.Effect of high-temperature on holding characteristics in MOSFET ESD protecting device. Acta Physica Sinica, 2022, 71(12): 128501.doi:10.7498/aps.71.20220172 |
[3] |
Li Guo-Chang, Li Sheng-Tao.Review of charge deposition characteristics and trap parameters of dielectric in space electron radiation environment. Acta Physica Sinica, 2019, 68(23): 239401.doi:10.7498/aps.68.20191252 |
[4] |
Liu Jing, Zhang Hai-Bo.Charging characteristics and micromechanism of space electrons irradiated polymers. Acta Physica Sinica, 2019, 68(5): 059401.doi:10.7498/aps.68.20181925 |
[5] |
Ma Qun-Gang, Wang Hai-Hong, Zhang Sheng-Dong, Chen Xu, Wang Ting-Ting.Electro-static discharge protection analysis and design optimization of interlayer Cu interconnection in InGaZnO thin film transistor backplane. Acta Physica Sinica, 2019, 68(15): 158501.doi:10.7498/aps.68.20190646 |
[6] |
Zhang Zhen-Xia, Wang Chen-Yu, Li Qiang, Wu Shu-Gui.Relationship between the quasi-linear diffusion coefficients and the key parameters of spatial energetic electrons. Acta Physica Sinica, 2014, 63(7): 079401.doi:10.7498/aps.63.079401 |
[7] |
Liu Jing, Zhang Hai-Bo.Steadystate charging characteristics of polymer irradiated by multi-energetic electrons. Acta Physica Sinica, 2014, 63(14): 149401.doi:10.7498/aps.63.149401 |
[8] |
Li Guo-Chang, Min Dao-Min, Li Sheng-Tao, Zheng Xiao-Quan, Ru Jia-Sheng.Research of deep dielectric charging characteristics of polytetrafluoroethene irradiated by energetic electrons. Acta Physica Sinica, 2014, 63(20): 209401.doi:10.7498/aps.63.209401 |
[9] |
Quan Rong-Hui, Han Jian-Wei, Zhang Zhen-Long.Macroscopic model of internal discharging in polymer under electron beam irradiation. Acta Physica Sinica, 2013, 62(24): 245205.doi:10.7498/aps.62.245205 |
[10] |
Ma Guo-Liang, Li Xing-Ji, Liu Hai, Liu Chao-Ming, Yang Jian-Qun, He Shi-Yu.Effect of grain size on energy deposition process in Ni metal during 1 MeV electron irradiation. Acta Physica Sinica, 2013, 62(9): 091401.doi:10.7498/aps.62.091401 |
[11] |
Wu Xiao-Peng, Yang Yin-Tang, Gao Hai-Xia, Dong Gang, Chai Chang-Chun.A compact model of substrate resistance for deep sub-micron gate grounded NMOS electrostatic discharge protection device. Acta Physica Sinica, 2013, 62(4): 047203.doi:10.7498/aps.62.047203 |
[12] |
Liu Yu-Dong, Du Lei, Sun Peng, Chen Wen-Hao.The effect of electrostatic discharge on the I-V and low frequency noise characterization of Schottky barrier diodes. Acta Physica Sinica, 2012, 61(13): 137203.doi:10.7498/aps.61.137203 |
[13] |
Liu La-Qun, Liu Da-Gang, Wang Xue-Qiong, Yang Chao, Xia Meng-Zhong, Peng Kai.The numerical simulation of the electronic energy deposition and temperature variation in post-hole convolute of magnetically insulated transmission lines. Acta Physica Sinica, 2012, 61(16): 162902.doi:10.7498/aps.61.162902 |
[14] |
Gao Zhu-Xiu, Li Hong-Wei, Cai Ming-Hui, Liu Dan-Qiu, Huang Jian-Guo, Han Jian-Wei.Discharging of charged material initiated by impacting of hypervelocity small debris. Acta Physica Sinica, 2012, 61(3): 039601.doi:10.7498/aps.61.039601 |
[15] |
Zhang Zhi-Quan, Zhang Yi-Fei, Zhou Li-Wei, Gong Hui.Imaging electron-optics and spatial-temporal aberrations for a bi-electrode spherical concentric system with electrostatic focusing. Acta Physica Sinica, 2010, 59(8): 5450-5458.doi:10.7498/aps.59.5450 |
[16] |
Zhang Zhi-Quan, Zhang Yi-Fei, Zhou Li-Wei, Gong Hui.Paraxial electron optics and its spatial-temporal aberrations for a bi-electrode concentric spherical system with electrostatic focusing. Acta Physica Sinica, 2010, 59(8): 5459-5466.doi:10.7498/aps.59.5459 |
[17] |
Zhang Bing, Chai Chang-Chun, Yang Yin-Tang.Effect of distances from source or drain to the gate on the robustness of sub-micron ggNMOS ESD protection circuit. Acta Physica Sinica, 2010, 59(11): 8063-8070.doi:10.7498/aps.59.8063 |
[18] |
Zhu Zhi-Wei, Hao Yue, Zhang Jin-Feng, Fang Jian-Ping, Liu Hong-Xia.A deep sub-micrometer NMOSFET non-local transport model for ESD effect. Acta Physica Sinica, 2006, 55(11): 5878-5884.doi:10.7498/aps.55.5878 |
[19] |
Huang Jian-Guo, Chen Dong.A study of characteristics for deep dielectric charging on satellites. Acta Physica Sinica, 2004, 53(3): 961-966.doi:10.7498/aps.53.961 |
[20] |
XIA MENG-FEN, QIU YUN-QING.SPATIAL DIFFUSION DRIVEN BY ELECTROSTATIC WAVES. Acta Physica Sinica, 1985, 34(3): 322-331.doi:10.7498/aps.34.322 |