[1] |
Ren Li-Qing, Yang Qiang, Ji Chao-Ran, Chi Jiao, Hu Yun, Wei Ying-Chun, Xu Jin-You.Spatial orientation of CdS nanowires based on second harmonic generation spectroscopy and microscopic imaging. Acta Physica Sinica, 2024, 73(16): 164207.doi:10.7498/aps.73.20240753 |
[2] |
He Yun, Yu Bin, Wang Qi, Bai Chun-Jiang, Yang Jing, Hu Tian-Cun, Xie Gui-Bai, Cui Wan-Zhao.Suppressing secondary electron emission from silver-plated surface by magnetron sputtered platinum. Acta Physica Sinica, 2018, 67(8): 087901.doi:10.7498/aps.67.20172740 |
[3] |
Pan Xiao, Ju Huan-Xin, Feng Xue-Fei, Fan Qi-Tang, Wang Chia-Hsin, Yang Yaw-Wen, Zhu Jun-Fa.Surface morphology of F8BT films and interface structures and reactions of Al on F8BT films. Acta Physica Sinica, 2015, 64(7): 077304.doi:10.7498/aps.64.077304 |
[4] |
Yu Sen-Jiang.Atomic force microscopy studies on self-organized wrinkles in constrained metallic films deposited on silicone oil substrates. Acta Physica Sinica, 2014, 63(11): 116801.doi:10.7498/aps.63.116801 |
[5] |
Wang Xian-Bin, Lin Xin, Wang Li-Lin, Bai Bei-Bei, Wang Meng, Huang Wei-Dong.Effect of crystallographic orientation on dendrite growth in directional solidification. Acta Physica Sinica, 2013, 62(10): 108103.doi:10.7498/aps.62.108103 |
[6] |
Jing Wei-Xuan, Wang Bing, Niu Ling-Ling, Qi Han, Jiang Zhuang-De, Chen Lu-Jia, Zhou Fan.Relationships between synthesizing parameters, morphology, and contact angles of ZnO nanowire films. Acta Physica Sinica, 2013, 62(21): 218102.doi:10.7498/aps.62.218102 |
[7] |
Wang Li-Lin, Wang Xian-Bin, Wang Hong-Yan, Lin Xin, Huang Wei-Dong.Effect of crystallographic orientation on instability behavior of planar interface in directional solidification. Acta Physica Sinica, 2012, 61(14): 148104.doi:10.7498/aps.61.148104 |
[8] |
Peng Shu-Ming, Shen Hua-Hai, Long Xing-Gui, Zhou Xiao-Song, Yang Li, Zu Xiao-Tao.The influence of deuteration and helium-implantation on the surface morphology and phase structure of scandium thick film. Acta Physica Sinica, 2012, 61(17): 176106.doi:10.7498/aps.61.176106 |
[9] |
Cao Yue-Hua, Di Guo-Qing.Analysis of Y2O3 doped TiO2 films topography prepared by radio frequency magnetron sputtering. Acta Physica Sinica, 2011, 60(3): 037702.doi:10.7498/aps.60.037702 |
[10] |
Di Guo-Qing.Surface morphology and optical properties of Ta2O5 films prepared by radio frequency sputtering. Acta Physica Sinica, 2011, 60(3): 038101.doi:10.7498/aps.60.038101 |
[11] |
Wang Hua-Tao, Qin Zhao-Dong, Ni Yu-Shan, Zhang Wen.Multi-scale simulation of the deformation in nano-indentation under different crystal orientations. Acta Physica Sinica, 2009, 58(2): 1057-1063.doi:10.7498/aps.58.1057 |
[12] |
Jiang Yang, Luo Yi, Xi Guang-Yi, Wang Lai, Li Hong-Tao, Zhao Wei, Han Yan-Jun.Effect of AlGaN intermediate layer on residual stress control and surface morphology of GaN grown on 6H-SiC substrate by metal organic vapour phase epitaxy. Acta Physica Sinica, 2009, 58(10): 7282-7287.doi:10.7498/aps.58.7282 |
[13] |
Li Ming-Yu, Gu Pei-Fu, Zhang Jin-Long, Zheng Zhen-Rong, Liu Xu.Study on the property of subwavelength imaging in a metal thin-film structure. Acta Physica Sinica, 2008, 57(7): 4564-4569.doi:10.7498/aps.57.4564 |
[14] |
Wu Ying-Cai, Gu Zheng-Tian.Research on the optimum thickness of metallic thin film utilized to excite surface plasmon resonance. Acta Physica Sinica, 2008, 57(4): 2295-2299.doi:10.7498/aps.57.2295 |
[15] |
Yu Zeng-Qiang, Wu Ke, Ma Xiao-Bai, Nie Rui-Juan, Wang Fu-Ren.Fabrication of MgB2 films via multilayer ex-situ annealing. Acta Physica Sinica, 2007, 56(1): 512-517.doi:10.7498/aps.56.512 |
[16] |
Gu Jian-Feng, Fu Wei-Jia, Liu Ming, Liu Zhi-Wen, Ma Chun-Yu, Zhang Qing-Yu.Highly c-axis textured ZnO thin films grown by electrochemical deposition and their optical properties. Acta Physica Sinica, 2007, 56(10): 5979-5985.doi:10.7498/aps.56.5979 |
[17] |
Yang Ji-Jun, Xu Ke-Wei.Surface dynamic evolution of Ta film growth in the initial stage. Acta Physica Sinica, 2007, 56(10): 6023-6027.doi:10.7498/aps.56.6023 |
[18] |
Wang Yuan, Bai Xuan-Yu, Xu Ke-Wei.Morphological characterization and nanoindentation hardness scatter evaluation for Cu-W thin films based on wavelet transform. Acta Physica Sinica, 2004, 53(7): 2281-2286.doi:10.7498/aps.53.2281 |
[19] |
Du Lei, Zhuang Yi-Qi, Xue Li-Jun.Aunifiedmodelfor 1 fnoiseand 1 f2 noiseduetoelectromigrationinmetalfilm. Acta Physica Sinica, 2002, 51(12): 2836-2841.doi:10.7498/aps.51.2836 |
[20] |
LIAO MEI-YONG, QIN FU-GUANG, CHAI CHUN-LIN, LIU ZHI-KAI, YANG SHAO-YAN, YAO ZHEN-YU, WANG ZHAN-GUO.INFLUENCE OF ION ENERGY AND DEPOSITION TEMPERATURE ON THE SURFACE MORPHOLOGY OF CARBON FILMS DEPOSITED BY ION BEAMS. Acta Physica Sinica, 2001, 50(7): 1324-1328.doi:10.7498/aps.50.1324 |