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Xu Si-Wei, Wang Xun-Si, Shen Xiang.Structure of GexGa8S92–xglasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scattering. Acta Physica Sinica, 2023, 72(1): 017101.doi:10.7498/aps.72.20221653 |
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Zhou Yi-Fan, Yang Mu-Zi, She Feng-Quan, Gong Li, Zhang Xiao-Qi, Chen Jian, Song Shu-Qin, Xie Fang-Yan.Application of X-ray photoelectron spectroscopy to study interfaces for solid-state lithium ion battery. Acta Physica Sinica, 2021, 70(17): 178801.doi:10.7498/aps.70.20210180 |
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Yang Meng-Sheng, Yi Tai-Min, Zheng Feng-Cheng, Tang Yong-Jian, Zhang Lin, Du Kai, Li Ning, Zhao Li-Ping, Ke Bo, Xing Pi-Feng.Surface oxidation of as-deposit uranium film characterized by X-ray photoelectron spectroscopy. Acta Physica Sinica, 2018, 67(2): 027301.doi:10.7498/aps.67.20172055 |
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Xu Si-Wei, Wang Li, Shen Xiang.Raman scattering and X-ray photoelectron spectra of GexSb20Se80-x Glasses. Acta Physica Sinica, 2015, 64(22): 223302.doi:10.7498/aps.64.223302 |
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Han Lu-Hui, Zhang Chong-Hong, Zhang Li-Qing, Yang Yi-Tao, Song Yin, Sun You-Mei.X-ray photoelectron spectroscopy study on GaN crystal irradiated by slow highly charged ions. Acta Physica Sinica, 2010, 59(7): 4584-4590.doi:10.7498/aps.59.4584 |
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao.X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica, 2009, 58(4): 2742-2745.doi:10.7498/aps.58.2742 |
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Li Han, Tang Xin-Feng, Zhao Wen-Yu, Zhang Qing-Jie.The structure and X-ray photoelectron spectroscopy analysis of double-atom filled skutterudite compounds. Acta Physica Sinica, 2006, 55(12): 6506-6510.doi:10.7498/aps.55.6506 |
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Ou Gu-Ping, Song Zhen, Gui Wen-Ming, Zhang Fu-Jia.Surface analysis of LiBq4/ITO and LiBq4/CuPc/ITO using atomic force microscopy and x-ray photoelectron spectroscopy. Acta Physica Sinica, 2005, 54(12): 5717-5722.doi:10.7498/aps.54.5717 |
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Feng Yu-Qing, Zhao Kun, Zhu Tao, Zhan Wen-Shan.Thermal stability of magnetic tunnel junctions investigated by x-ray photoelectron spectroscopy. Acta Physica Sinica, 2005, 54(11): 5372-5376.doi:10.7498/aps.54.5372 |
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Jia Wen-Hong, Wu Hai-Shun.Studies on structures and photoelectron spectroscopy of GamPn and GamP-n clusters. Acta Physica Sinica, 2004, 53(4): 1056-1062.doi:10.7498/aps.53.1056 |
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He Shao-Long, Li Hong-Nian, Li Hai-Yang, Zhang Han-Jie, Lü Bin, He Pi-Mo, Bao Shi-Ning, Xu Ya-Bo.X-ray photoemission studies of Yb intercalated C60 thin film. Acta Physica Sinica, 2004, 53(3): 915-921.doi:10.7498/aps.53.915 |
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Xin Yu, Ning Zhao-Yuan, Cheng Shan-Hua, Lu Xin-Hua, Wang Mei-Fu, Xu Sheng-Hua, Ye Chao, Huang Song, Du Wei.. Acta Physica Sinica, 2002, 51(8): 1865-1869.doi:10.7498/aps.51.1865 |
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YUAN JIN-SHE, CHEN GUANG-DE, QI MING, LI AI-ZHEN, XU ZHUO.XPS AND AES INVESTIGATION OF GaN FILMS GROWN BY MBE. Acta Physica Sinica, 2001, 50(12): 2429-2433.doi:10.7498/aps.50.2429 |
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LI LIU-HE, ZHANG HAI-QUAN, CUI XU-MING, ZHANG YAN-HUA, XIA LI-FANG, MA XIN-XIN, SUN YUE.COMPARATIVE ANALYSIS OF DLC FLIM FINE STRUCTURE BY RAMAN SPECTRA AND X-RAY PHOTOELECTRON SPECTROSCOPY. Acta Physica Sinica, 2001, 50(8): 1549-1554.doi:10.7498/aps.50.1549 |
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JI ZHEN-GUO, CHEN LI-DENG, MA XIANG-YANG, YAO HONG-NIAN, QUE DUAN-LIN.. Acta Physica Sinica, 1995, 44(1): 57-63.doi:10.7498/aps.44.57 |
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WANG NAN-LIN, SHA JIAN, ZHANG QI-RUI, WANG XI-QING, QIAN YI-TAI, CHEN ZU-YAO.X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON THE ELECTRONIC STATE OF Gd-DOPED 2212 SINGLE CRYSTAL IN Bi-BASED SYSTEM. Acta Physica Sinica, 1992, 41(4): 655-660.doi:10.7498/aps.41.655 |
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ZHONG ZHAN-TIAN, WANG DA-WEN, LIAO XIAN-BO, FAN YUE, LI CHENG-FANG, MOU SHAN-MING.XPS AND AES STUDY FOR Au/a-Si:H INTERFACE. Acta Physica Sinica, 1991, 40(2): 275-280.doi:10.7498/aps.40.275 |
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ZHAO LIANG-ZHONG.XPS STUDIES OF A SERIES OF Ce(Ⅳ) AND Ce(Ⅲ) COMPOUNDS. Acta Physica Sinica, 1989, 38(6): 987-990.doi:10.7498/aps.38.987 |
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ZHANG HAN, HE ZHEN-HUI, ZHAO YONG, SUN SHI-FANG, QIAN YI-TAI, ZHANG QI-RUI.AN XPS STUDY ON Y-Ba-Cu-Al-O SYSTEM. Acta Physica Sinica, 1989, 38(4): 689-693.doi:10.7498/aps.38.689 |
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Yu Ming-ren, Yang Guang, Wang Xun.DETERMINATION OF THE ATOMIC CONCENTRATION RATIO ON InP (100) CLEAN SURFACES BY X-RAY PHOTOELECTRON SPECTROSCOPY. Acta Physica Sinica, 1983, 32(6): 799-802.doi:10.7498/aps.32.799 |
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