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Liu Bao-Jian, Duan Wei-Bo, Li Da-Qi, Yu De-Ming, Chen Gang, Wang Tian-Hong, Liu Ding-Quan.Effect of annealing temperature on structure and stress properties of Ta2O5/SiO2multilayer reflective coatings. Acta Physica Sinica, 2019, 68(11): 114208.doi:10.7498/aps.68.20182247 |
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Xi Guang-Ping, Ma Xiang-Yang, Tian Da-Xi, Zeng Yu-Heng, Gong Long-Fei, Yang De-Ren.Effects of low-temperature annealing on oxygen precipitate nucleation in heavily arsenic-doped Czochralski silicon. Acta Physica Sinica, 2008, 57(11): 7108-7113.doi:10.7498/aps.57.7108 |
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Cao Bo, Bao Liang-Man, Li Gong-Ping, He Shan-Hu.Diffusion and interface reaction of Cu and Si in Cu/SiO2/Si (111) systems. Acta Physica Sinica, 2006, 55(12): 6550-6555.doi:10.7498/aps.55.6550 |
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Chen Chang-Yong, Chen Wei-De, Wang Yong-Qian, Song Shu-Fang, Xu Zhen-Jia.Influence of coupling between Er3+, nc-Si and nonradiative centers on photoluminescence from Er3+-doped nc-Si/SiO2 films. Acta Physica Sinica, 2003, 52(3): 736-739.doi:10.7498/aps.52.736 |
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SHANG YE-CHUN, ZHANG YI-MEN, ZHANG YU-MING.MONTE CARLO STUDY ON INTERFACE ROUGHNESS DEPENDENCE OF ELECTRON MOBILITY IN 6H-SiC INVERSION LAYERS. Acta Physica Sinica, 2001, 50(7): 1350-1354.doi:10.7498/aps.50.1350 |
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