The great number of incomplete pseudo-Kossel lines, which can not be avoided and are normally useless in divergent-beam X-ray diffraction, can be used for obtaining the information about interplanar spacings, inclination angles of diffraction planes and the film shifts in multiple exposures with the dual-element radiation method. Therefore, those problems such as the identification of diffraction indices, the determination of crystal orientation and the precise measurement of lattice constants etc. can be solved by the use of diffraction patterns in one experiment.